In industrial level measurement, not all technologies are designed for broad applicability. While some methods are selected for their versatility across multiple process environments, others are ...

High-voltage capacitance-voltage (HV C-V) measurements are an increasingly important for characterizing the latest generation of wide-bandgap power semiconductor devices because the measurements are ...

In back-end semiconductor processing it is important to improve the performance of semiconductors due to the limitations of miniaturization in front-end processes. To achieve this goal, the industry ...

This paper defines a method to measure the chip die pad capacitance using time delay reflectometry (TDR). This method is useful for measuring the low-value capacitance that is present at the end of a ...

An optimal way to determine an op amp's input capacitance. Steps involved in making the input-capacitance measurement. 1. With a series resistor at the op-amp input, the input capacitance of the op ...