Design patterns are particularly useful for partitioning anapplication into tasks running under an RTOS. Typically, these designpatterns fall into three groups: desynchronizing, synchronizing, ...

Both scan ATPG and IJTAG patterns are used to test a piece of logic that is part of a much larger SoC design. For both, the patterns are independent of the logic in the actual design. Both ...

Integrating pattern matching with DFM operations ensures designs are quickly and accurately optimized for reliability, performance, and manufacturing prior to tapeout.